Corescan - instrument for mapping of Contact Resistance of front side grid

Corescan is used for detailed surface mapping of contact resistance between the emitter and the metallization grid of solar cells. Other standard mapping modes in the instrument are for shunt resistance; short circuit current (LBIC) and open circuit voltage (Voc).
Corescan instrument is indispensable for optimisation of cell efficiency, trouble shooting and R&D.

Links to application examples for the different scan methods of the Corescan:

Corescan
Map the contact resistance of the front side metallisation and optimise the metallisation process.

Shuntscan
Locate shunts on solar cells and find out about their nature.

Voc scan
Find the locations of increased recombination (on research cells without front side metallisation).

LBIC scan
Find the regions on a solar cell with lower bulk lifetime, optimise gettering and hydrogen passivation.