Publications

	Mapping of contact resistance and locating shunts on solar cells using Resistance Analysis by Mapping of Potential (RAMP) techniques - Proceedings 16th European Photovoltaic Solar Energy Conference, Glasgow (United Kingdom), page 1438 (2000).
	Error diagnosis and optimisation of c-Si solar cell processing using contact resistances determined with the Corescanner - Proceedings 12th Photovoltaic Science and Engineering Conference, Jeju (Korea), page 591 (2001).
	Error diagnosis and optimisation of c-Si solar cell processing using contact resistances determined with the Corescanner - Solar Energy Materials & Solar Cells 74, page 43 (2002). This is a pre-print version; submitted 2001 at the 12th PVSEC in Jeju, Korea (see above). The original paper is available via Elsevier ScienceDirect.
	Contact resistance scanning for process optimization: the Corescanner method - 11th NREL workshop on crystalline silicon solar cell materials and processes, Estes Park (Colorado, USA), page 293 (2001).
	Shunt detection in solar cells with the Corescanner and lock-in thermography: a comparison - 11th NREL workshop on crystalline silicon solar cell materials and processes, Estes Park (Colorado, USA), page 253 (2001).
	Contact resistances measured using the Corescan: relations with cell processing - Proceedings 17th European Photovoltaic Solar Energy Conference, Munich (Germany), page 1531 (2001).
	Optimizing the front side metallization process using the Corescan - Proceedings 29th IEEE Photovoltaic Specialists Conference, New Orleans (Louisiana, USA), page 340 (2002).
	Locating losses due to contact resistance, shunts and recombination by potential mapping with the Corescan - 12th NREL workshop on crystalline silicon solar cell materials and processes, Breckenridge (Colorado, USA), page 117 (2002).
	Simple, detailed & fast firing furnace temperature profiling for improved efficiency - Proceedings of the conference PV in Europe - From PV technology to energy solutions, Rome (Italy), page 276 (2002).
	Influence of grain orientation on contact resistance at higher emitter sheet resistances, investigated for alkaline and acid saw damage removal - Proceedings 3rd World Conference on Photovoltaic Energy Conversion, Osaka (Japan), page 1036 (2003).
	Explanation of high solar cell diode factors by nonuniform contact resistance - Progress in Photovoltaics 13, page 3 (2005). This PDF is a preprint version, the original paper is available at Wiley InterScience.
	New approach for firing optimisation in crystalline silicon cell technology - Proceedings 19th European Photovoltaic Solar Energy Conference, Paris (France), page 1044 (2004).
	Contact optimisation on lowly doped emitters using the Corescan on non-uniform emitter cells - Proceedings 19th European Photovoltaic Solar Energy Conference, Paris (France), page 701 (2004).
	Lead free metallisation paste for crystalline silicon solar cells: from model to results - Proceedings 31st IEEE Photovoltaic Specialists Conference, Orlando (Florida, USA), to be published.